Dose, exposure time and resolution in serial X-ray crystallography

Starodub, D.; Rez, P.; Hembree, G.; Howells, M.; Shapiro, D.; Chapman, H.N.; Fromme, P.; Schmidt, K.; Weierstall, U.; Doak, R.B.; Spence, J.C.H.

doi:10.1107/S0909049507048893

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Figure 4
(a) Reconstruction r.m.s. error in real space, averaged over many independent reconstructions, as a function of counting time. The solid line shows the best fit to the data points by a power law. (b) Distribution of the r.m.s. error in two sets of independent reconstructions for counting times of 10 s and 1 s.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 15| Part 1| December 2008| Pages 62-73

doi:10.1107/S0909049507048893

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