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Figure 3
(a) Transmission of a 300 nm-thick silicon nitride film at angles ranging from 0.18° to 0.26°. (b) Transmission of a second 300 nm-thick silicon nitride film at angles 0.22° and 0.24°. The small peaks between 8 and 9 keV in the transmission curves are a result of both copper and zinc fluorescent contamination in the signal that we were unable to eliminate, which most likely originated as trace elements within the Kapton tape.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 15| Part 4| May 2008| Pages 371-373
doi:10.1107/S0909049508007607
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