Synchrotron applications of an amorphous silicon flat-panel detector

Lee, J.H.; Aydıner, C.C.; Almer, J.; Bernier, J.; Chapman, K.W.; Chupas, P.J.; Haeffner, D.; Kump, K.; Lee, P.L.; Lienert, U.; Miceli, A.; Vera, G.

doi:10.1107/S090904950801755X

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Figure 12
Diffraction image of Cu/Nb multilayers with 27 nm layer thickness. The azimuthal angle η, integration interval Δη and reflection rings are shown in the figure. The unlabeled rings inside the Cu 220 ring are due to the thin layer of CeO₂ standard on the surface of the sample.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 15| Part 5| July 2008| Pages 477-488

doi:10.1107/S090904950801755X

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