Synchrotron applications of an amorphous silicon flat-panel detector

Lee, J.H.; Aydıner, C.C.; Almer, J.; Bernier, J.; Chapman, K.W.; Chupas, P.J.; Haeffner, D.; Kump, K.; Lee, P.L.; Lienert, U.; Miceli, A.; Vera, G.

doi:10.1107/S090904950801755X

Journal of Synchrotron Radiation Journal of
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Figure 13
Average stress of the Cu/Nb multilayer is plotted against its tensile direction lattice strains in representative reflections of Nb (110) and Cu (220) for both quasi-static stepwise loading and 0.7 × 10⁻² s⁻¹ strain rate.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 15| Part 5| July 2008| Pages 477-488

doi:10.1107/S090904950801755X

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