Synchrotron applications of an amorphous silicon flat-panel detector

Lee, J.H.; Aydıner, C.C.; Almer, J.; Bernier, J.; Chapman, K.W.; Chupas, P.J.; Haeffner, D.; Kump, K.; Lee, P.L.; Lienert, U.; Miceli, A.; Vera, G.

doi:10.1107/S090904950801755X

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 3
The response of the detector (ADU) versus incident photon flux. The maximum value of R is about 3% and its average value over the whole measurement range is 0.77%. The dotted line in the upper plot is a linear fit to measured data.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 15| Part 5| July 2008| Pages 477-488

doi:10.1107/S090904950801755X

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