Synchrotron applications of an amorphous silicon flat-panel detector

Lee, J.H.; Aydıner, C.C.; Almer, J.; Bernier, J.; Chapman, K.W.; Chupas, P.J.; Haeffner, D.; Kump, K.; Lee, P.L.; Lienert, U.; Miceli, A.; Vera, G.

doi:10.1107/S090904950801755X

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 8
(a) The average dark signal (per pixel) is plotted against different exposure times at different gain settings. (b) The standard deviation of the detector dark signal is plotted against different exposure times at different gain settings.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 15| Part 5| July 2008| Pages 477-488

doi:10.1107/S090904950801755X

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