A twelve-analyzer detector system for high-resolution powder diffraction

Lee, P.L.; Shu, D.; Ramanathan, M.; Preissner, C.; Wang, J.; Beno, M.A.; Von Dreele, R.B.; Ribaud, L.; Kurtz, C.; Antao, S.M.; Jiao, X.; Toby, B.H.

doi:10.1107/S0909049508018438

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Figure 5
Si(111) diffraction peaks of mixed Si/Al₂O₃ standard from 12 individual analyzers. The intensity is scaled to counts s⁻¹ (100 mA)⁻¹ of ring current individually without correction for detector sensitivity. The intensities are also offset by 10000 between the neighboring analyzers for clarity.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 15| Part 5| July 2008| Pages 427-432

doi:10.1107/S0909049508018438

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