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Figure 6
A section of a powder pattern of Si/Al2O3 measured at 30.862 keV (0.401738 Å) displays the data-merging process: (a) a section of the raw data showing each of the 12 analyzers with only monitor correction and scaled to 100 mA synchrotron ring current; (b) the previous 12 diffractograms, but now corrected with the sensitivity, zero and wavelength calibration results listed in Table 2[link]; (c) the merged diffractogram; (d) fitting of the merged pattern, with data marked as crosses, a solid red line for the calculated pattern, and the blue curve under the pattern for differences. Residuals for the fit are Rwp = 9.92%, Rp = 7.2% and χ2 = 2.204.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 15| Part 5| July 2008| Pages 427-432
doi:10.1107/S0909049508018438
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