view article

Figure 1
Experimental set-up for the high-energy X-ray reflectivity measurements. a, slit system; b, NaI normalization detector; c, slit system; d, auto-absorber system and fast shutter (XIA); e, slit system; f, NaI normalization detector; g, sample cell; h, slit system; i, slit system; j, NaI detector.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds