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Figure 1
Experimental set-up for the high-energy X-ray reflectivity measurements. a, slit system; b, NaI normalization detector; c, slit system; d, auto-absorber system and fast shutter (XIA); e, slit system; f, NaI normalization detector; g, sample cell; h, slit system; i, slit system; j, NaI detector.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 15| Part 6| October 2008| Pages 600-605
doi:10.1107/S0909049508026745
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