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Figure 5
Logarithm of the X-ray reflectivities normalized by the Fresnel reflectivity from the CO2–silicon interface. For better visualization the reflectivies are shifted vertically. Refinements of the reflectivities are shown as solid lines.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 15| Part 6| October 2008| Pages 600-605
doi:10.1107/S0909049508026745
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