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Figure 3
Intensity line scans for the (a) single-step, (b) double-step and (c) multi-step features indicated in the XRIM images in Fig. 2[link]. The vertical dashed lines indicate the step locations. The same integration regions shown in Fig. 2[link] for the single-step structure were used to obtain line scans on all three structures in each image. The angular offset from the specular condition for each line scan is (from bottom to top): 0.02°, 0.01°, 0.0°, −0.01°, −0.02°, −0.03° and −0.035°, and are indicated in (a).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 15| Part 6| October 2008| Pages 558-571
doi:10.1107/S0909049508023935
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