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Figure 8
AFM micrograph of the surface of a multilayered sample of InGaAs QDs grown on GaAs (411)B. The inset shows a Fourier transform of the height profile.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 15| Part 6| October 2008| Pages 549-557
doi:10.1107/S0909049508023856
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