A dedicated small-angle X-ray scattering beamline with a superconducting wiggler source at the NSRRC

Liu, D.-G.; Chang, C.-H.; Liu, C.-Y.; Chang, S.-H.; Juang, J.-M.; Song, Y.-F.; Yu, K.-L.; Liao, K.-F.; Hwang, C.-S.; Fung, H.-S.; Tseng, P.-C.; Huang, C.-Y.; Huang, L.-J.; Chung, S.-C.; Tang, M.-T.; Tsang, K.-L.; Huang, Y.-S.; Kuan, C.-K.; Liu, Y.-C.; Liang, K.S.; Jeng, U.-S.

doi:10.1107/S0909049508034134

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Figure 3
(a) Calculated photon flux density profiles for the beams reflected from the Rh/Pt-coated and the bare Si surfaces of the CM. The intensity dip around 23 keV for the former is due to the K-edge absorption of Rh at 23.22 keV. (b) The CM with water-cooling pipes is on a holder equipped with five spring plungers (indicated by arrows) for correcting the manufacture slope error.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 16| Part 1| November 2009| Pages 97-104

doi:10.1107/S0909049508034134

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