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Figure 3
XMCD measurements from L2,3 edges of Ni and Fe films on Si(100) (see text for details).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 16| Part 3| March 2009| Pages 346-351
doi:10.1107/S090904950900243X
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