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Figure 6
(a) Schematic idea of how point-to-point focusing of a spherically bent analyser crystal can be used for imaging a macroscopic sample which the X-ray beam penetrates through. (b) An image on a pixel detector at the peak of the quasi-elastic line showing an H2O sample (at x = z = 0) inside a Be gasket. The contrast between the scattering cross sections of the sample and the gasket can be seen clearly, the sample giving higher intensity and appearing as an intense (here, dark) spot.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 16| Part 4| June 2009| Pages 469-476
doi:10.1107/S090904950901886X
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