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Figure 4
Calculated reflection-mode X-ray absorption near-edge spectra for a layer of 3.5 nm crystalline Cu2O on a copper metal substrate [as shown schematically in the inset of Fig. 3[link](a)] and a grazing angle Θ = 0.2° and various different r.m.s. roughness values for the Cu2O/air surface (σ1) and the inner Cu2O/Cu interface (σ2) as indicated. For comparison, a spectrum of a smooth (σ = 0 Å) oxide-free Cu metal sample is shown in (b); this spectrum is shifted downwards by 0.05 for a better visualization.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 16| Part 4| May 2009| Pages 443-454
doi:10.1107/S0909049509015684
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