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Figure 7
Magnitude of the Fourier transforms of the k-weighted reflectivity fine structures calculated for a Cu2O film of 3.5 nm thickness on a Cu substrate each with 15 Å surface roughness compared with several model systems with different thickness of the Cu2O layer neglecting any surface and interface roughness, i.e. σ1 = σ2 = 0 Å. (Incidence angle Θ = 0.2°; the data are not corrected for phase shifts. k-range for the FTs: 1.75 Å−1 < k < 11.75 Å−1.)

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 16| Part 4| May 2009| Pages 443-454
doi:10.1107/S0909049509015684
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