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Figure 1
(a) SEM micrograph of the chip allowing both electrical and structural measurements. The Bi-2212 whisker lies vertically, along the whole figure height, and is indicated by the large red arrow. The four Ag/Au contacts run horizontally and are indicated by the four black arrows. The a- and b-axes are shown, with the c-axis pointing out of the plane of the paper. (b) Scheme of the experimental set-up adopted at the microfocused ID22 beamline for both µ-XRD and µ-XRF acquisitions. Details are labelled as follows: 1, incoming beam; 2, KB mirrors; 3, ionization chamber; 4, alignment microscope; 5, rotating sample holder allowing full α angle rotation; 6, XRF detector; 7, FreLoN detector for diffracted beam.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 16| Part 6| October 2009| Pages 813-817
doi:10.1107/S0909049509036802
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