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Figure 4
(a) µ-XRD image of the as-grown Bi-2212 crystal mounted on the chip. Two main series of (00l) reflections are visible with an angle of ∼14° between them. Diffraction rings from the Ag/Au contacts are also visible. (b) Two-dimensional AFM scanning of the sample showing that the upper surface profile is composed of two main planes misaligned by ∼14° (left). Thickness profile sampled along the red line (right).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 16| Part 6| October 2009| Pages 813-817
doi:10.1107/S0909049509036802
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