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Figure 6
(a) CCD image of a specular reflection from a polystyrene (10 nm thick) coated Si substrate at 1.5° incident angle and with full-circle in-plane rotation. The sample normal points up. (b) Comparison of the vertical intensity profiles of the specular peak with (red) and without (black) in-plane motion.

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ISSN: 1600-5775
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