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Figure 7
Grazing-incidence diffraction data collected from the TIPS-pentacene sample. On the left is the CCD image collected with continuously varying incident angle and the intensity profile along the (00L) direction. On the right are the CCD images collected at 1.5° incident angle with continuous in-plane sample rotation and the intensity profile collapsed onto the qr axis. Note that the CCD image on the right has been translated onto the undistorted qrqz plane, hence the dark gap in the upper left corner, which corresponds to information not accessible in the diffraction pattern. A diffraction pattern from a bare silicon substrate was subtracted as scattering background.

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