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Figure 4
White-beam topography of the (220) reflection for two typical phase plates made from synthetic diamonds produced by the high-pressure high-temperature method. The top panel refers to an older plate made from type-Ib material (nitrogen-rich, 100 p.p.m.); it shows mainly images of dislocations and strain fields related to growth sector boundaries. The lower panel shows a recently produced plate made from type-IIa material (very low nitrogen concentration, less then 0.1 p.p.m.). Only a few dislocation lines, related to stacking faults which are out of contrast, are present.

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