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Figure 3
XRD data of zircon pressurized in diamond anvil cells (a) unirradiated and (b) irradiated with 1.47 GeV Xe ions of fluence 5 × 1012 cm−2 (Lang, Zhang et al., 2008BB18). (a) The undamaged zircon gradually transformed to reidite above 25.5 GPa, as indicated by new peaks (arrows); the sample quenched from 37 GPa showed only reidite diffraction peaks. The vertical bars indicate the diffraction-peak positions of the zircon structure. (b) The irradiated specimen showed no phase transition up to 36.2 GPa; the quenched sample exhibited only typical zircon diffraction peaks.

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