view article

Figure 6
Two radiographs of an Mg2SiO4 forsterite sample taken at different times during deformation at 7 GPa pressure and 1673 K, as obtained through the gap in between the lateral anvils of the D-DIA that equips beamline X17-B2 of the NSLS (Upton, NY, USA). The black horizontal lines are the image of thin Re foils placed at sample ends and used as strain markers. White arrows indicate the sample shortening (∼10% strain). Note the anvil gap opening during deformation while lateral anvils are moving backwards.

Journal logoJOURNAL OF
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds