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Figure 4
Example of a two-dimensional X-ray diffraction pattern of polycrystalline ringwoodite obtained under high pressure (a). G002 represents a diffraction peak of graphite (002 reflection) and other numbers represent indices of diffraction peaks of ringwoodite. The pair of arrows show the compression directions. The converted pattern of (a) from the original form in polar coordinates into the Cartesian system is also shown (b). We can clearly see the detector azimuth angle (δ) dependence of 2θ for all the diffraction peaks of ringwoodite observed in this pattern.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 16| Part 6| September 2009| Pages 742-747
doi:10.1107/S0909049509033342
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