Characterization of wax as a potential diffraction intensity standard for macromolecular crystallography beamlines

Brandao-Neto, J.; Thompson, S.P.; Lennie, A.R.; Ferreira, F.F.; Tang, C.C.

doi:10.1107/S0909049509040709

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Figure 7
Diffraction strength of 110 (filled circles) and 200 (filled squares) reflections measured on D10B-XPD powder beamline as a function of specimen thickness: (a) peak intensity and (b) integrated intensity. I04 MX data corrected to account for differences in beamline and instrumental details (§3.4

) are also plotted as an open circle (110) and open square (200) in (b). All data have been scaled to 10¹⁰ photons s⁻¹ and the angle (per degree) of detection. Note that for the D10B-XPD and I04 (200) data the error bars are smaller than the plotted points.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 17| Part 1| January 2010| Pages 53-60

https://doi.org/10.1107/S0909049509040709

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