Characterization of wax as a potential diffraction intensity standard for macromolecular crystallography beamlines

Brandao-Neto, J.; Thompson, S.P.; Lennie, A.R.; Ferreira, F.F.; Tang, C.C.

doi:10.1107/S0909049509040709

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 8
Stability of the 110 and 200 peak intensities when exposed to a high-intensity X-ray beam on I11 at Diamond. Each point represents a single scan. Missing points at ∼0.5 and ∼5.25 are due to storage ring refill.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 17| Part 1| January 2010| Pages 53-60

https://doi.org/10.1107/S0909049509040709

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