Development and exploration of a new methodology for the fitting and analysis of XAS data

Delgado-Jaime, M.U.; Kennepohl, P.

doi:10.1107/S090904950904655X

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 12
Half width at half-maximum (γ) and inflection point (I) of the edge function (f_e, black solid line) and related properties in the associated background function (f_b, grey solid line). The relative change in steepness of the features are accentuated for clarity.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 17| Part 1| January 2010| Pages 119-128

https://doi.org/10.1107/S090904950904655X

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