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Figure 4
Wire scan measurements for the focused X-ray beam, generated from a Si kinoform structure at the sample position, under the condition corresponding to Fig. 3(c)[link]. The vertical size of the focused beam was determined by fitting the derivative of the raw data (as shown in the inset) and was found with a FWHM of 2 µm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 17| Part 2| March 2010| Pages 237-242
https://doi.org/10.1107/S0909049509055009
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