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Figure 6
Fitted XRR profile of the Mo/Si multilayer structure at an incident X-ray energy of 19 keV corresponding to the measured XRR profile shown in Fig. 5(a)[link]. From this figure it can be seen that fitted and measured XRR profiles match quite well at lower incidence angles as well as at higher incidence angles.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 17| Part 2| March 2010| Pages 237-242
https://doi.org/10.1107/S0909049509055009
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