view article

Figure 6
Fitted XRR profile of the Mo/Si multilayer structure at an incident X-ray energy of 19 keV corresponding to the measured XRR profile shown in Fig. 5(a)[link]. From this figure it can be seen that fitted and measured XRR profiles match quite well at lower incidence angles as well as at higher incidence angles.

Journal logoJOURNAL OF
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds