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Figure 7
Measured and fitted XRR profiles of an Nb/C/Nb trilayer structure investigated at different locations (1, 2, 3,…, 6) on the sample surface. We used a focused X-ray beam of energy E = 12 keV from kinoform lens optics and performed the XRR measurements in sample scanning mode. The inset indicates the different locations for XRR measurement on the Nb/C/Nb sample surface as marked by the numbers. Each point was separated by 2 mm.

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ISSN: 1600-5775
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