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Figure 7
Measured and fitted XRR profiles of an Nb/C/Nb trilayer structure investigated at different locations (1, 2, 3,…, 6) on the sample surface. We used a focused X-ray beam of energy E = 12 keV from kinoform lens optics and performed the XRR measurements in sample scanning mode. The inset indicates the different locations for XRR measurement on the Nb/C/Nb sample surface as marked by the numbers. Each point was separated by 2 mm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 17| Part 2| March 2010| Pages 237-242
https://doi.org/10.1107/S0909049509055009
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