view article

Figure 4
Ni K-edge XAFS data measured on NiO using one channel of the four-channel apparatus compared with the same sample measured using the normal XAFS beamline instrumentation. The XANES (top), extracted EXAFS signal (middle) and the magnitude and real part of the Fourier transform (bottom) are shown.

Journal logoJOURNAL OF
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds