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Figure 4
Ni K-edge XAFS data measured on NiO using one channel of the four-channel apparatus compared with the same sample measured using the normal XAFS beamline instrumentation. The XANES (top), extracted EXAFS signal (middle) and the magnitude and real part of the Fourier transform (bottom) are shown.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 17| Part 3| March 2010| Pages 380-385
doi:10.1107/S0909049510006230
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