Performance of a four-element Si drift detector for X-ray absorption fine-structure spectroscopy: resolution, maximum count rate, and dead-time correction with incorporation into the ATHENA data analysis software

Woicik, J.C.; Ravel, B.; Fischer, D.A.; Newburgh, W.J.

doi:10.1107/S0909049510009064

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 2
Experimental geometry used to measure detector intensity versus I₀ (see text). Also shown is a photograph of the stepped wedge used to vary the photon intensity.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 17| Part 3| April 2010| Pages 409-413

doi:10.1107/S0909049510009064

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