Performance of a four-element Si drift detector for X-ray absorption fine-structure spectroscopy: resolution, maximum count rate, and dead-time correction with incorporation into the ATHENA data analysis software

Woicik, J.C.; Ravel, B.; Fischer, D.A.; Newburgh, W.J.

doi:10.1107/S0909049510009064

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 3
Intensity versus I₀ scans measured by scanning the stepped wedge of Fig. 2

vertically through the X-ray beam for element #1 of the SDD as a function of amplifier shaping time. Also shown are the best fits to the data points. The fitted dead-time parameters τ_d are given in the legend (see text).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 17| Part 3| April 2010| Pages 409-413

doi:10.1107/S0909049510009064

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