Performance of a four-element Si drift detector for X-ray absorption fine-structure spectroscopy: resolution, maximum count rate, and dead-time correction with incorporation into the ATHENA data analysis software

Woicik, J.C.; Ravel, B.; Fischer, D.A.; Newburgh, W.J.

doi:10.1107/S0909049510009064

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 6
Illustration of the ATHENA XAFS dead-time correction. Shown is the SDD spectrum from SrMnO₃ uncorrected for dead-time, the SDD spectrum corrected for dead-time assuming $[\tau_{\rm{d}}^{\,\rm{ICR}}]$ = 0 (simple correction), and the SDD spectrum corrected for dead-time using the experimentally determined values for $[\tau_{\rm{d}}^{\,\rm{ICR}}]$ (full correction). The SDD spectra are compared with the spectrum acquired by an ion chamber that suffers no dead-time loss. Note that in the latter case the two spectra are indistinguishable. The inset shows an expanded view of the Mn pre-edge feature.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 17| Part 3| April 2010| Pages 409-413

doi:10.1107/S0909049510009064

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