Wavelength-dispersive spectrometer for X-ray microfluorescence analysis at the X-ray microscopy beamline ID21 (ESRF)

Szlachetko, J.; Cotte, M.; Morse, J.; Salomé, M.; Jagodzinski, P.; Dousse, J.-C.; Hoszowska, J.; Kayser, Y.; Susini, J.

doi:10.1107/S0909049510010691

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 10
Top panels: X-ray fluorescence maps of S and Pb in the painting cross section containing the altered area. (a) The PB-WDS X-ray fluorescence spectrum recorded in the altered (red) and safe (black) areas. (b) The same as (a) but acquired using a SDD detector.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 17| Part 3| April 2010| Pages 400-408

doi:10.1107/S0909049510010691

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page