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Figure 5
Solid line: Gaussian profile used as reflectivity in the present simulations. Dotted line: Gaussian profile with the scattering owing to the 0.2 nm roughness (r.m.s.). Dashed line: broad diffraction profile curve owing to the random layer thickness fluctuation (Δd/d) with the scattering owing to the 0.2 nm roughness (r.m.s.).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 17| Part 3| March 2010| Pages 352-359
doi:10.1107/S0909049510004383
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