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Figure 8
Spectral measurement on (a) Si and (b) CdTe exposed to a 16 keV and 35 keV flat field, respectively.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 17| Part 4| May 2010| Pages 486-495
doi:10.1107/S0909049510013257
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