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Figure 4
(a) X-ray interference pattern for a vertical orientation of the X-ray bi-prism. The fit, obtained numerically as described in the text, is a solid line. (b) The same type of measurement and the fit for the horizontal orientation. The right-hand insets in (a) and (b) are CCD interference patterns. (c) Lateral spatial variation of the visibility factor for two mutually perpendicular positions of the X-ray bi-prism optics.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 17| Part 4| May 2010| Pages 451-455
doi:10.1107/S0909049510012823
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