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Figure 3
Reflectivity scans using Cu Kα radiation (twin-mirror arrangement) on selected multilayer mirrors: Pd/B4C with 220 bi-layers (sample 1680), W/Si with 120 bi-layers (sample 1531) and Mo/Si with 220 bi-layers (sample 1574), all 2.5 nm nominal d-spacing. See also Figs. 8[link] and 9[link]. Curves for W/Si and Mo/Si are shifted for better visibility.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 17| Part 4| May 2010| Pages 496-510
doi:10.1107/S0909049510011623
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