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Figure 4
Micro-roughness (high spatial frequency, measured with a Micromap Promap 520 interference microscope) of the substrate with Mo/Si multilayer (left), Pd/B4C multilayer (middle) and W/Si multilayer coating (right), magnification 20× (see also Tables 1[link] and 2[link]).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 17| Part 4| May 2010| Pages 496-510
doi:10.1107/S0909049510011623
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