Figure 7
Influence of the d-spacing on the beam profile, determined via the stripe modulations in full-field imaging (left column: monochromatic illumination; right column: pseudo-polychromatic illumination, acquired at BM05, ESRF). Top: sample 1574 (Mo/Si, N = 220, d = 2.478 nm); middle: sample 1601 (Mo/Si, N = 80, d = 3.975 nm); bottom: sample 1609 (Mo/Si, N = 50, d = 5.492 nm) (bottom right image probably smeared owing to beam/crystal monochromator instabilities). |