view article
Figure 8
Influence of the material composition on the beam profile, determined via the stripe modulations in full-field imaging (left column: monochromatic illumination; right column: pseudo-polychromatic illumination, acquired at BM05, ESRF). Top: sample 1574 (Mo/Si, N = 220, d = 2.478 nm); middle: sample 1531 (W/Si, N = 120, d = 2.528 nm); bottom: sample 1680 (Pd/B4C, N = 220, d = 2.468 nm). See also Figs. 9[link] and 10[link].

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 17| Part 4| May 2010| Pages 496-510
doi:10.1107/S0909049510011623
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS