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Figure 2
Microprobe characterization. Differentiated horizontal (solid) and vertical (dashed) profiles acquired with a moving blade at the intermediate focus position with a micro-image of the spot in the inset (a). Normalized long-distance knife-edge profiles at the SO focal plane showing the scattered background for 95 eV (dashed), 74 eV (solid) and 27 eV (dotted) SOs acquired with a photodiode (b). For comparison, the profile for the 74 eV SO acquired with a photoelectron analyzer is also shown (dash-and-dot). The insert table summarizes the percentage of overall intensity confined inside the focal point for different photon energies and acquisition types. Series of knife-edge profiles at the sample position varying in position along the beam axis (c) with the knife-edge profile in the best focus (d).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 17| Part 4| May 2010| Pages 445-450
doi:10.1107/S0909049510013993
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