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Figure 6
Two scans over the same area of sample B (CuInS2): (a) SXES scan recording the integrated S L2,3 emission and (b) SXES scan of the integrated Zn M4,5L2,3 and O L2,3 emission (the O L2,3 emission is recorded in the second diffraction order). The stepwise increase of the ZnO-layer thickness is clearly resolved in the scan images as (a) decreasing and (b) increasing emission intensity of the corresponding signals (bright = high intensity).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 17| Part 6| September 2010| Pages 791-798
doi:10.1107/S0909049510031444
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