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Figure 4
Ge silicalite crystallization process followed by (a) powder X-ray diffraction (2 min acquisition) and (b) XAS (10 s acquisition).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 18| Part 2| March 2011| Pages 176-182
https://doi.org/10.1107/S0909049510046546
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