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Figure 9
Top: measured spectrum through a 10 µm × 10 µm pinhole of the beam optimized for 35.5 keV. Bottom: spatial distribution of the flux at 35.500 ± 0.005 keV perpendicular to the beam at the focus. |
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Figure 9
Top: measured spectrum through a 10 µm × 10 µm pinhole of the beam optimized for 35.5 keV. Bottom: spatial distribution of the flux at 35.500 ± 0.005 keV perpendicular to the beam at the focus. |