view article
Figure 9
(a) Power density spectrum of synchrotron light at the Elettra Deep X-ray Lithography beamline. (b) Normalized transmittance of photons as a function of incident photon energy (eV) calculated for a silica dense film of thickness 0.1 µm (black line), 0.5 µm (red line) and 1 µm (blue line).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 18| Part 2| March 2011| Pages 280-286
https://doi.org/10.1107/S0909049510051666
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS