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Figure 3
Photograph showing the in situ XAFS apparatus equipped with a microfluidic cell. The incident beam intensity is monitored by an ion chamber in front of a reactor. A silicon drift diode detector is used to record the fluorescence signal. The temperature distribution and optical image of a heated reactor channel is monitored by an IR-TV camera and a telescopic TV camera, respectively.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
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