Time-resolved photoelectron spectroscopy using synchrotron radiation time structure

Bergeard, N.; Silly, M.G.; Krizmancic, D.; Chauvet, C.; Guzzo, M.; Ricaud, J.P.; Izquierdo, M.; Stebel, L.; Pittana, P.; Sergo, R.; Cautero, G.; Dufour, G.; Rochet, F.; Sirotti, F.

doi:10.1107/S0909049510052301

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Figure 3
Detector image obtained by measuring the Si-2p core level of a SiO₂/Si(111) sample with a photon energy of 650 eV and a pass energy of 200 eV at normal emission in angular-resolved mode. The photoemission intensity spectrum obtained by integrating on the emission angle is shown on the right.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 18| Part 2| March 2011| Pages 245-250

https://doi.org/10.1107/S0909049510052301

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